Advanced local microstructural characterization

Advanced position-resolved analytical methods with submicron resolution are required to characterize depth-dependent properties of individual coating components. These requirements are fulfilled by synchrotron nano-beam X-ray diffraction of coating cross-sections in transmission arrangement, which allows in-situ investigations of structural depth-variations and depth-profiles of the stress state with a resolution below 100 nm.

Position-resolved microstructure and stress measurements are performed at synchrotron facilities at European Synchrotron Radiation Facility in Grenoble (France), at Berlin Electron Storage Ring Society for Synchrotron Radiation in Berlin (Germany) and at German Electron Synchrotron in Hamburg (Germany).